Editor: Rasit O. Topaloglu

Recent Topics on Modeling of Semiconductor Processes, Devices, and Circuits

Volume 1

eBook: US $44 Special Offer (PDF + Printed Copy): US $141
Printed Copy: US $119
Library License: US $176
ISBN: 978-1-60805-695-8 (Print)
ISBN: 978-1-60805-074-1 (Online)
Year of Publication: 2011
DOI: 10.2174/97816080507411110101

Introduction

The last couple of years have been very busy for the semiconductor industry and researchers. The rapid speed of production channel length reduction has brought lithographic challenges to semiconductor modeling. These include stress optimization, transistor reliability and efficient circuit design with respect to interconnects, power and leakage at the chip level. This e-book focuses on the latest semiconductor techniques devised to address these issues. It should be a useful resource for electronic engineers and semiconductor chip designers.

Contributors

Editor(s):
Rasit O. Topaloglu
GLOBALFOUNDRIES
USA




Co-Editor(s):
Peng Li
Texas A&M University
USA




Contributor(s):
Yu Cao
Arizona State University



Charlie C.P. Chen
National Taiwan University



Zhuo Feng
Michigan Technological University



Lei He
University of California at Los Angeles



Yu H. Hu
University of Wisconsin at Madison



Srikanth Krishnan
Texas Instruments



Jongwook Kye
GLOBALFOUNDRIES



Peng Li
Texas A&M University



Dongkeun Oh
University of Wisconsin at Madison



Vijay Reddy
Texas Instruments



Ruijing Shen
University of California at Riversid



Yiyu Shi
Missouri University of Science and Technology



Sheldon X.-D. Tan
University of California at Riverside



Rasit O. Topaloglu
GLOBALFOUNDRIES



Wenping Wang
Arizona State University



Richard Q. Williams
IBM



Guo Yu
Oracle



Hao Yu
Nanyang Technological University





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