Editors: Victor Pereyra, Godela Scherer

Exponential Data Fitting and its Applications

eBook: US $59 Special Offer (PDF + Printed Copy): US $148
Printed Copy: US $119
Library License: US $236
ISBN: 978-1-60805-345-2 (Print)
ISBN: 978-1-60805-048-2 (Online)
Year of Publication: 2010
DOI: 10.2174/97816080504821100101

Introduction

Real and complex exponential data fitting is an important activity in many different areas of science and engineering, ranging from Nuclear Magnetic Resonance Spectroscopy and Lattice Quantum Chromodynamics to Electrical and Chemical Engineering, Vision and Robotics. The most commonly used norm in the approximation by linear combinations of exponentials is the l2 norm (sum of squares of residuals), in which case one obtains a nonlinear separable least squares problem. A number of different methods have been proposed through the years to solve these types of problems and new applications appear daily. Necessary guidance is provided so that care should be taken when applying standard or simplified methods to it. The described methods take into account the separability between the linear and nonlinear parameters, which have been quite successful. The accessibility of good, publicly available software that has been very beneficial in many different fields is also considered. This Ebook covers the main solution methods (Variable Projections, Modified Prony) and also emphasizes the applications to different fields. It is considered essential reading for researchers and students in this field.

Contributors

Editor(s):
Victor Pereyra
San Diego State University
USA


Godela Scherer
University of Reading
UK




Contributor(s):
Christina Ankjærgaard
Radiation Research Division, Riso National Laboratory for Sustainable Energy, Technical University of Denmark
Roskilde, DK-4000
Denmark


Kaustav Banerjee
Department of Electrical and Computer Engineering
University of California
Santa Barbara
CA, 93106
USA


Saul D. Cohen
Thomas Jefferson National Accelerator Facility Newport News
VA, 23606
USA


George T. Fleming
Department of Physics
Yale University
New Haven
CT, 06520
USA


Per Christian Hansen
Department of Informatics and Mathematical Modelling
Technical University of Denmark Kgs
Lyngby, DK-2800
Denmark


Mayank Jain
Radiation Research Division, Riso National Laboratory for Sustainable Energy, Technical University of Denmark
Roskilde, DK-4000
Denmark


Linda Kaufman
Computer Science Dept
William Patterson University
Coach House, Room 213
Wayne
NJ
USA


Marianela Lentini
Escuela de Matematicas, Universidad Nacional de Colombia, Sede Medellin
Colombia


Huey-Wen Lin
Department of Physics
University of Washington
Seattle
WA, 98195
USA


Rafael Martín
Centro de Fisica Molecular y Medica Escuela de Fisica, Facultad de Ciencias , Universidad Central de Venezuela
Caracas
Venezuela


Miguel Martín-Landrove
Centro de Fisica Molecular y Medica, Escuela de Fisica Facultad de Ciencias Universidad Central de Venezuela y Centro de Diagnóstico Docente Las Mercedes
Caracas
Venezuela


Katharine M. Mullen
Ceramics Division National Institute of Standards and Technology (NIST)
100 Bureau Drive, M/S 8520
Gaithersburg
MD, 20899
USA


Dianne P. O'Leary
Computer Science Department
Institute for Advanced Computer Studies University of Maryland, College Park, MD 20742; and National Institute of Standards and Technology
Gaithersburg
MD, 20899-8910



Hans Bruun Nielsen
Department of Informatics and Mathematical Modelling
Technical University of Denmark
DK-2800 Kgs
Lyngby
Denmark


Marco Paluszny
Escuela de Matematicas Universidad Nacional de Colombia
Medellín
Colombia


Victor Pereyra
Weidlinger Associates Inc. (retired)
399 W. El Camino Real, #200 Mountain View, CA , USA
CA, 94040
USA
/
Computational Sciences Research Institute,San Diego State University
San Diego
CA
USA


Jean-Baptiste Poullet
Formerly with Department of Electrical Engineering ESAT-SCD
Katholieke Universiteit Leuven
Kasteelpark Arenberg 10, 3001 Leuven-Heverlee
Belgium


Bert W. Rust
Mathematical and Computational Sciences Division National Institute of Standards and Technology (NIST)
100 Bureau Drive, MS 8910
Gaithersburg
MD, 20899-8910
USA


Godela Scherer
Mathematics Department
University of Reading
UK


Diana M. Sima
Department of Electrical Engineering ESAT-SCD
Katholieke Universiteit Leuven Kasteelpark Arenberg 10
Leuven-Heverlee, 3001
Belgium


Navin Srivastava
Mentor Graphics Corporation
8005 SW Boeckman Rd
Wilsonville
Oregon, 97070
USA


Roberto Suaya
Mentor Graphics Corporation
110 rue Blaise Pascal
St Ismier Cedex, 38334
France


Wuilian Torres
Centro de Procesamiento Digital de Imagenes, Instituto de Ingenieria y, Laboratorio de Computacion Grafica y Geometria Aplicada, Escuela de Matematica, Facultad de Ciencias,Universidad Central de Venezuela
Caracas
Venezuela


Sabine Van Huffel
Department of Electrical Engineering ESAT-SCD
Katholieke Universiteit Leuven
Kasteelpark Arenberg 10, 3001 Leuven-Heverlee
Sabine
Belgium


Ivo H. M. van Stokkum
Department of Physics and Astronomy
Faculty of Sciences, Vrije Universiteit Amsterdam, de Boelelaan 1081
1081 HV Amsterdam
The Netherlands




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