Chapter 3

Noise Source Impedance Measurement in SMPS

Vuttipon Tarateeraseth, Kye Yak See and Flavio G. Canavero

Abstract

<p>An accurate measurement method to extract common mode (CM) and differential mode (DM) noise source impedances of a switched-mode power supply (SMPS) under operating condition is presented in this chapter. With a proper pre-measurement calibration process, the proposed method allows extraction of both the CM and the DM noise source impedances with very good accuracy. These noise source impedances come in handy to systematically design an electromagnetic interference filter for a SMPS with minimum hassle.</p>

Total Pages: 38-56 (19)

Purchase Chapter  Book Details

RELATED BOOKS

.Modern Intelligent Instruments - Theory and Application.
.Bipolar Transistor and MOSFET Device Models.
.Electromagnetics for Engineering Students: Part 1.
.Advances in Nonconventional Machining Processes.
.Micro and Nanomachining Technology-Size, Model and Complex Mechanism.
.The Mechanical Vibration: Therapeutic Effects and Applications.
.Advances in Multiphase Flow and Heat Transfer.