Chapter 9

Residual Stresses/Strains Analysis

Cong Qiuzi, Yu Xiang and He Li


INTRODUCTION </p> <p> General Considerations </p> <p> X-ray stress measurement method takes advantage of X-ray diffraction phenomena and is used to obtain the stress in metallic materials, ceramics and polycrystalline aggregates by measuring their lattice distortions. This method has salient features: a) the measurement is non-contact and non-destructive; b) not only the added stress but also the residual stress is measurable; c) exceedingly small portions (approximate 1mm2) in a thin layer (a few μm or less) of the sample are examined. This measurement technique is especially effective, such as....

Total Pages: 84-96 (13)

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