Author: Wang Zhuo

The Theory and Method of Design and Optimization for Railway Intelligent Transportation Systems (RITS)

eBook: US $64 Special Offer (PDF + Printed Copy): US $160
Printed Copy: US $128
Library License: US $256
ISBN: 978-1-60805-323-0 (Print)
ISBN: 978-1-60805-138-0 (Online)
Year of Publication: 2011
DOI: 10.2174/97816080513801110101

Introduction

Foreword

- Pp. i
Dong Bao-tian
Download Free

Preface

- Pp. ii
Wang Zhuo, Jia Li-min
Download Free

Contributors

- Pp. iii
Wang Zhuo, Jia Li-min
Download Free

Outline of Railway Intelligent Transportation System (RITS)

- Pp. 1-28 (28)
Wang Zhuo, Jia Li-min

PDF Price: $15

View Abstract Purchase Chapter

Research on RITS System Framework

- Pp. 29-75 (47)
Wang Zhuo, Jia Li-min

PDF Price: $15

View Abstract Purchase Chapter

RITS Structure Optimization Design Theory

- Pp. 76-99 (24)
Wang Zhuo, Jia Li-min

PDF Price: $15

View Abstract Purchase Chapter

Optimization Design Example of Intelligent Emergency Rescue and Safety System

- Pp. 100-122 (23)
Wang Zhuo, Jia Li-min

PDF Price: $15

View Abstract Purchase Chapter

RITS Universal Technology Platform and Application

- Pp. 123-136 (14)
Wang Zhuo, Jia Li-min

PDF Price: $15

View Abstract Purchase Chapter

Chinese RITS in Development

- Pp. 137-145 (9)
Wang Zhuo, Jia Li-min

PDF Price: $15

View Abstract Purchase Chapter

References

- Pp. 146-147 (2)
Wang Zhuo, Jia Li-min

PDF Price: $15

View Abstract Purchase Chapter

Index

- Pp. 148-149 (2)
Wang Zhuo, Jia Li-min
View Abstract

RELATED BOOKS

.Robotics and Automation in Industry 4.0.
.Advances in Additive Manufacturing Processes.
.Advances in Manufacturing Technologies and Production Engineering.
.Advances in Nonconventional Machining Processes.
.Reinventing Technological Innovations with Artificial Intelligence.
.Induction Motor Computer Models in Three-Phase Stator Reference Frames: A Technical Handbook.
.Coherent Wireless Power Charging and Data Transfer for Electric Vehicles.
.Fault Tolerant Drive By Wire Systems: Impact on Vehicle Safety and Reliability.