Chapter 8

Depth/Azimuth-Resolved Multiple-XRD Patterns for Nanomaterials

Cong Qiuzi, Yu Xiang and He Li


INTRODUCTION </p> <p> Based on basic theories of 2D X-ray diffraction, which are essential and fundamental for the development of X-ray techniques, at present, we try to show how to apply these theories to explore and address problems of depth/azimuth-solved multiple-XRD patterns for nanomaterial. Since microstructure is one of the important parameters which control properties of thin films, Structure characterization of materials is therefore essential for the research and development of thin film technology [3-14]. </p> <p> XRD is frequently used for the characterization of thin films and modified surfaces. Although several instruments with different geometries have been devised to adapt the technique for the study of often strongly textured, thin layers among them being the most flexible tool probably use the conventional Bragg-Brentano (B-B) goniometer. Now, the presented common scan mode facilitated to have multifunction. Reliable procedures have been devised on a routine basis for phase identification, precision measurements of lattice parameters and quantitative phase analysis. The possibility of studies for thin layers is very attractive by using these STD and ADA as well as CBD, techniques.....

Total Pages: 74-83 (10)

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